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  • Contents EDT '94...
    http://ballade.cs.ucla.edu/~kohcc/sigdacdrom/edt95/edt94/toc.htm

  • Toboggan-Based Intelligent Scissors with a Four Parameter Edge Model ...
    http://cs.oregonstate.edu/~enm/publications/CVPR_99/toboggan_scissors.pdf

  • Boundary-Scan Testing of High-Speed Differential Signals ...
    http://csdl.computer.org/comp/proceedings/itc/2001/7171/00/71711187.pdf

  • Reducing test application time in scan design schemes...
    http://csdl.computer.org/comp/proceedings/vts/1995/7000/00/70000367abs.htm

  • H-SCAN: A high level alternative to full-scan testing with reduced area and test...
    http://csdl.computer.org/comp/proceedings/vts/1996/7304/00/73040074abs.htm

  • Test Data Decompression for Multiple Scan Designs with Boundary Scan...
    http://doi.ieeecomputersociety.org/10.1109/12.736428

  • Boundary Scan-Based Relay Wave Propagation Test of Arrays of Identical Structure...
    http://doi.ieeecomputersociety.org/10.1109/12.956088

  • Märtens, Holger: Options in Scan Processing for Shared-Disk Parallel Database Sy...
    http://dol.uni-leipzig.de/pub/1998-33/en

  • Using a single input to support multiple scan chains...
    http://dx.doi.org/10.1145/288548.288563

  • Multimode scan...
    http://dx.doi.org/10.1145/944027.944033

  • SandyDuck '97 Experiment Descriptions...
    http://frf.usace.army.mil/SandyDuck/Exp-SandyDuck.stm

  • IEEE P1149.4 Working Group Meeting Minutes for October 22, 1995...
    http://grouper.ieee.org/groups/1149/4/min1095.html

  • Scalable Core Test Access Architecture...
    http://grouper.ieee.org/groups/1500/vts97/ctap.html

  • Testing of Integrated Circuits ...
    http://humanresources.web.cern.ch/Humanresources/external/training/tech/spe

  • "Shape modeling with front propagation: A level set approach" Citations...
    http://iacl.ece.jhu.edu/projects/gvf/gvf_cite/malladi_cite_abstract.html

  • Untitled...
    http://inp.cie.rpi.edu/research/mcdonald/frisc/reports/fall93/f93.html

  • A p p l i c a t i o n N o t e ...
    http://klabs.org/richcontent/fpga_content/DesignNotes/SX_And_SX-S/sx_sxa_jt

  • PRINCIPLES OF ...
    http://media.wiley.com/product_data/excerpt/17/04713193/0471319317.pdf

  • Appendix One...
    http://nppp.jpl.nasa.gov/asic/Appendix.1.html

  • Boundary-Scan Integration to In-Circuit Test ...
    http://orion.polito.it/tttc/BTW/2003/material/BTW03%20Session%202%20Slides/

  • Saddlepoint approximations and nonlinear boundary crossing probabilities of Mark...
    http://projecteuclid.org/Dienst/UI/1.0/Display/euclid.aoap/1050689586

  • 0 ...
    http://www-corot.obspm.fr/COROT-ETC/Files/Xilinx/Virtex-II-1.5V.pdf

  • Recovering Transient Failures on FPGA Applications ...
    http://www-crc.stanford.edu/crc_slides/robert050100.pdf

  • FPGA Fault Recovery by Reconfiguration ...
    http://www-crc.stanford.edu/crc_slides/robert080700.pdf

  • Fast and Energy-Frugal Deterministic Test Through ...
    http://www-cse.ucsd.edu/users/ozgur/DFT02.pdf

  • Fast and Energy-Frugal Deterministic Test Through ...
    http://www-cse.ucsd.edu/users/ozgur/JSA03.pdf

  • ...
    http://www-ee.ccny.cuny.edu/xchen/EE464outline.doc

  • A p p l i c a t i o n N o t e ...
    http://www.actel.com/documents/SX_SXAJTAG.pdf

  • Engineer To Engineer Note EE-76 ...
    http://www.adaptyv.com/doc/analog/jtag_ee_76.pdf

  • Agilent In-circuit Test...
    http://www.agilent.com/see/3070

  • "A21C" in fm00...
    http://www.agu.org/cgi-bin/wais?q=A21C

  • PCI 9056 ...
    http://www.alcom.be/DATASHEET/ProductBrief9056.pdf

  • Chapter 6. Device ...
    http://www.altera.com.cn/literature/hb/cfg/cfg_cf52006.pdf

  • 3. Configuration & Testing ...
    http://www.altera.com.cn/literature/hb/stx/ch_3_vol_1.pdf

  • 3. Configuration & Testing ...
    http://www.altera.com/literature/hb/cyc/cyc_c51003.pdf

  • Chapter 3. Configuration & ...
    http://www.altera.com/literature/hb/stx2/stx2_sii51003.pdf

  • Efficient Algorithms for Solving Static ...
    http://www.ama.caltech.edu/~seanm/thesis.pdf

  • TESTABILITY FEATURES OF THE MDSP ...
    http://www.ap-asic.org/2000/proceedings/15-4.pdf

  • APG Test Consultants, Inc....
    http://www.apgtest.com/scan_reasons.html

  • Debug of ARMTM based systems using EmbeddedICETM ...
    http://www.ashling.com/technicalarticles/ARMDebugv10.pdf

  • Connect - ASSET InterTech...
    http://www.asset-intertech.com/connect/2004Q1/observations.htm

  • Mixed Signal VLSI Wireless Design...
    http://www.ateworld.com/books/view_details.cfm?id=103

  • High Speed CMOS Design Styles...
    http://www.ateworld.com/books/view_details.cfm?id=120

  • Product Backgrounder ...
    http://www.bist.com/pdf/LV2004_backgrounder.pdf

  • A Comparison of Simulation Based and Scan Chain Implemented Fault Injection ...
    http://www.ce.chalmers.se/~johan/publications/ftcs28camera.frm.pdf

  • TurboDFT -- DFT Integration and Stitching DFT Cores...
    http://www.ceopower.com/products/dft/turbodft.html

  • Circuit Cellar - Digital Library - 109 Anderson...
    http://www.circuitcellar.com/library/print/0899/Anderson109/7.htm

  • CITIDEL...
    http://www.citidel.org/

  • Civic Strategies Metro Areas Scan...
    http://www.civic-strategies.com/resources/areas_scan.htm

  • ...
    http://www.co-ra.com/cases/C99OvLat.html

  • Online Monitoring for Automotive Sub-systems Using 1149.4 ...
    http://www.comp.lancs.ac.uk/microsystems/publications/Online%20Monitoring%2

  • CHAPTER 8 ­ CONCLUSIONS AND RECOMMENDED WORK ...
    http://www.computationaltools.com/Papers/Chapter8_Ref_Appendix.pdf

  • CS 259 - CAD: Design Issues and Modeling and Optimization Techniques...
    http://www.cs.ucla.edu/~miodrag/CS259_CAD.htm

  • DATE - DATE04 Programme Sessions Search Results:...
    http://www.date-conference.com/cgi-bin/prog04/searchdateprog.cgi?search=tut

  • ...
    http://www.deec.ist.utl.pt/meec/phdeec/programa_pdeec_0405.html

  • ( ESNUG 300 Item 3 ) ---------------------------------------------- [10/7/98]...
    http://www.deepchip.com/items/0300-03.html

  • ( ESNUG 422 Item 4 ) -------------------------------------------- [02/19/04]...
    http://www.deepchip.com/items/0422-04.html

  • BOARD DFT Course...
    http://www.dft.co.uk/board-dft.html

  • 748 IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOL. 47, NO. 3, JUNE 1...
    http://www.dftmicrosystems.com/docs/papers/Hawrysh_Roberts_0698.pdf

  • RUTGERS UNIV. Lectures in Machine Vision...
    http://www.ece.rutgers.edu/~freeman/c561topi.htm

  • Test Vector Decompression via Cyclical Scan Chains and Its Application to Testin...
    http://www.ece.utexas.edu/~touba/research/cmprs-itc98.ps

  • CpE 166 Advanced Logic Design Required Course ...
    http://www.ecs.csus.edu/cpe/mainpages/course/CpE166_2002_3.pdf

  • EDN - Design holds the key to cost-effective SOC testing - 5/16/2002 - EDN - CA2...
    http://www.edn.com/article/CA216163.html

  • EDN - FROM EDN EUROPE: Simple boundary-scan techniques tackle sophisticated syst...
    http://www.edn.com/article/CA90986.html

  • Test Resource Partitioning and Reduced Pin-Count Testing Based on Test Data ...
    http://www.ee.duke.edu/~krish/075_chandra_a.pdf

  • A Partition-Based Approach for Identifying Failing Scan Cells in Scan-BIST ...
    http://www.ee.duke.edu/~krish/DATE03_Liu.pdf

  • Project Topics...
    http://www.ee.ualberta.ca/~cockburn/ee651/projTopics.html

  • ISD Archived Magazine Issues and Articles...
    http://www.eedesign.com/editorial/1998/asicfeature9803.html

  • ISD Archived Magazine Issues and Articles...
    http://www.eedesign.com/editorial/2000/test0009.html

  • THSENS temperature sensor family...
    http://www.eet.bme.hu/laboratories/thermal/thermosens.html

  • Notes on the Troubleshooting and Repair of Computer and Video Monitors...
    http://www.eio.com/repairfaq/sam/monfaq.htm

  • AC Extest Meeting ...
    http://www.employees.org/~acjtag/AC_Extest_Meeting_May_21_2001.pdf

  • Frequency Activity/Edge ...
    http://www.employees.org/~acjtag/ProtocolComparison64.pdf

  • Table of Contents...
    http://www.engr.scu.edu/mourad/booktoc.htm

  • ...
    http://www.evaluationengineering.com/archive/articles/0697low.htm

  • Design for Testability - September 1995 - AT&T...
    http://www.evaluationengineering.com/archive/articles/0995bist.htm

  • ABIS ...
    http://www.fe.up.pt/~jms/ID/abis.pdf

  • Hewlett-Packard Journal: Component and system level design-for-testability featu...
    http://www.findarticles.com/p/articles/mi_m0HPJ/is_n2_v46/ai_16864192

  • FPGA FAQ comp.arch.fpga archives - messages from 60650...
    http://www.fpga-faq.com/archives/60650.html

  • Freescale Semiconductor MCF5271EC ...
    http://www.freescale.com/files/32bit/doc/data_sheet/MCF5271EC.pdf

  • Preliminary ...
    http://www.gigasemi.com/890DV18.pdf

  • Preliminary ...
    http://www.gigasemi.com/890QV18.pdf

  • ...
    http://www.hackpalace.com/cracking/copy-protection/how%20to%20crack.txt

  • Abstracts...
    http://www.hep.ph.ic.ac.uk/leb97/Abstracts.html

  • Summaries...
    http://www.hep.ph.ic.ac.uk/~leb97/Summaries.html

  • Agilent In-circuit Test...
    http://www.home.agilent.com/USeng/nav/-536886612.0/pc.html

  • SSoCC'01 4/3/01 ...
    http://www.ida.liu.se/~zebpe/teaching/test/lec13.pdf

  • A Study of BIST with Multiples Scan Chains ...
    http://www.ifip.or.at/con2000/icda2000/icda-4-2.pdf

  • EDAC 1994...
    http://www.informatik.uni-trier.de/~ley/db/conf/eurodac/eurodac1994.html

  • IEEE VLSI Test Symposium 1997...
    http://www.informatik.uni-trier.de/~ley/db/conf/vts/vts1997.html

  • FPGA & CPLD Programmable Logic Devices - Lattice Semiconductor...
    http://www.latticesemi.com/account/_download.cfm

  • ispMACHTM 4A Family ...
    http://www.latticesemi.com/lit/docs/datasheets/cpld/im4aarch.pdf

  • ispMACHTM 4A CPLD Family ...
    http://www.latticesemi.com/lit/docs/datasheets/cpld/ispm4a.pdf

  • MACH 4 CPLD Family ...
    http://www.latticesemi.com/lit/docs/datasheets/cpld/mach4.pdf

  • PXI ...
    http://www.lecroy.com/tm/Library/WhitePapers/PDF/WP_PXI_MV.pdf

  • Product Backgrounder ...
    http://www.logicvision.com/pdf/LV2004_backgrounder.pdf

  • ASIC Test Engineer - Wilmington, MA Job Code MAA09...
    http://www.loringassociates.com/jobs/asic-test.html

  • Orbital cyclicities above and below the Cretaceous / Paleogene boundary...
    http://www.lumina.demon.nl/thesis/Ch3b

  • Generating Models from Multiple Volumes ...
    http://www.merl.com/papers/docs/TR99-09.pdf

  • Scan Times...
    http://www.nrao.edu/~cwalker/sched/sched/node17.html

  • Dmitry Kuznetsov - VEC4JTAG - Boundary Scan Test (BST)...
    http://www.orc.ru/~dkuzn/v4j_e.htm

  • INE Web Sites (With Active Links)...
    http://www.padrak.com/ine/WEBSITES.html

  • 160Gbit/s SONET/SDH ADM-on-a-Chip ...
    http://www.paramanet.com/pdf/PNI8160-w.pdf

  • V E R S I O N 1 . 0 2 0 0 2 ...
    http://www.plxtech.com/products/io_accelerators/pci9056/briefs/9056.pdf

  • Marketing Tools / Software...
    http://www.pro-marketing-online.com/

  • JTAG-ISP Information: Flash PSD ...
    http://www.qnx.com.pl/pliki/an054.pdf

  • Implementing a Scheme for External Deterministic Self-Test ...
    http://www.ra.informatik.uni-stuttgart.de/~ghermanv/philips/awhakmi_externa

  • MINIMIZED POWER CONSUMPTION FOR SCAN-BASED BIST ...
    http://www.ra.informatik.uni-stuttgart.de/~virazela/LP_Project/ger99.pdf

  • EDN - Design holds the key to cost-effective SOC testing - 5/16/2002 - EDN - CA2...
    http://www.reed-electronics.com/ednmag/index.asp?layout=article&articleid=C

  • Test & Measurement World - Extend the frontiers of boundary-scan test - 2/1/2001...
    http://www.reed-electronics.com/tmworld/article/CA187304.html

  • Test & Measurement World - In-circuit test helps ensure PCB quality - 4/1/2001 -...
    http://www.reed-electronics.com/tmworld/article/CA187324.html

  • Design methodology for the S/390 Parallel Enterprise Server G4 microprocessors...
    http://www.research.ibm.com/journal/rd/414/shepard.html

  • AJish Thomas.Net...
    http://www.rit.edu/~aat2404/courses.htm

  • JOURNAL ...
    http://www.rivier.edu/faculty/vriabov/riabov_JTHT_V10_No1_1996_p126.pdf

  • INTEGRATED CIRCUITS ...
    http://www.semiconductors.philips.com/acrobat/datasheets/TDA8046H_2.pdf

  • Synthesis of BIST Hardware for Performance Testing of ...
    http://www.sigda.org/Archives/ProceedingArchives/Iccad/Iccad98/papers/1998/

  • ...
    http://www.sigmaram.com/2x2B4.PDF

  • SOCcentral - Table of Contents...
    http://www.soccentral.com/soccentral-toc.asp

  • Final Q and A...
    http://www.state.me.us/dhs/finalanswers.htm

  • SCAN_13-01_20-03...
    http://www.sti.nasa.gov/scan/scan12.html

  • SCAN_71-01_76-04...
    http://www.sti.nasa.gov/scan/scan70.html

  • Application Note: Virtex Series ...
    http://www.support.xilinx.com/bvdocs/appnotes/xapp151.pdf

  • Untitled Document...
    http://www.syntest.com/PressReleaseArchive/20010312-lg.htm

  • PR-SynTest Growth...
    http://www.syntest.com/PressReleaseArchive/20030602DFTPROPlus.htm

  • TurboScan ...
    http://www.syntest.com/ProdDataSheet/TS_datasheet072103a.pdf

  • BOARD TEST ...
    http://www.teradyne.com/atd/resource/docs/victory/tm_boundary_rolince_2-200

  • A Roadmap for Boundary-Scan Test Reuse ...
    http://www.teradyne.com/atd/resource/docs/victory/wp_itc96_wedge.pdf

  • > Boundary Scan Developer ...
    http://www.testsystems.se/pdf/Boundary_Scan_Course.pdf

  • Jim Taylor's Official DVD FAQ...
    http://www.thedigitalbits.com/officialfaq.html

  • Theory and Application of the Mixed...
    http://www.twentest.com/TarADboundary.htm

  • Verity-Check...
    http://www.veritable.com/Computer/Formal_Validation/Verity-Check/verity-che

  • WISchip - POWERING DIGITAL CONVERGENCE...
    http://www.wischip.com/careers_engineering.php

  • Application Note: Spartan-II and Spartan-IIE Families ...
    http://www.xilinx.com/bvdocs/appnotes/xapp176.pdf

  • 0 ...
    http://www.xilinx.com/bvdocs/publications/ds012.pdf

  • 0 CoolRunner XPLA3 CPLD ...
    http://www.xilinx.com/bvdocs/publications/ds109-1.pdf

  • Xilinx Online Remote White Paper...
    http://www.xilinx.com/xilinxonline/remote_wp.htm

  • Xfce 4 diary...
    http://xfce.org/~benny/

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